| 摘要 |
A semiconductor device defines a peripheral circuit region and a central circuit region. The peripheral circuit region includes a control signal wiring extending through the peripheral circuit region, a first cell having a test terminal connecting to the control signal wiring, N number of second cells that input and/or output signals, each having a signal terminal, and a plurality of third cells, each having a power source terminal. Among N number of the second cells, n (n<N) number of the second cells have input signal wirings coupled to the signal terminals, and potential fixing circuits that fix the potential on the input signal wirings. Each of the potential fixing circuits has one of a plurality of control terminals. A plurality of serially connected buffers are coupled to the control signal wiring. The control signal wiring connects to the control terminals of the potential fixing circuits, wherein the control terminals are provided with a logic that turns on the potential fixing circuits during normal operation, and when a signal is inputted in the test terminal, the potential fixing circuits turn off. The plurality of serially connected buffers are disposed in the plurality of the third cells, but not disposed in N number of the second cells.
|
