发明名称 Semiconductor device having improved short channel resistance
摘要 First, first conductivity type impurities are injected into a semiconductor substrate to selectively form a first conductivity type region. Next, second conductivity type impurities higher in concentration than that of the first conductivity type impurities are injected into a predetermined region in the first conductivity type region to selectively form a second conductivity type region. Then, first conductivity type impurities are selectively injected into the second conductivity type region to selectively form a lightly doped second conductivity type region. By the step, a concentration distribution is formed in which a concentration of first conductivity type impurities increases from the first conductivity type region toward the lightly doped second conductivity type region.
申请公布号 US6426535(B1) 申请公布日期 2002.07.30
申请号 US19990411942 申请日期 1999.10.04
申请人 NEC CORPORATION 发明人 TAKEUCHI KIYOSHI;KUMASHIRO SHIGETAKA
分类号 H01L21/265;H01L21/336;H01L29/78;(IPC1-7):H01L29/76 主分类号 H01L21/265
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