发明名称 SELF-DIAGNOSITIC CIRCUIT AND SYSTEM LSI TESTER
摘要 PROBLEM TO BE SOLVED: To provide a technique whereby a required time for self diagnosis and calibration can be shortened. SOLUTION: There are provided a multi-channel high accuracy voltage- measuring device 100 having two measurement channels, and a diagnosis analog route 4 for connecting respective analog unit/pin electronics 22a of test heads 2a and 2b with the multi-channel voltage-measuring device. The multi-channel voltage-measuring device measures output voltages of the analog unit/pin electronics of the two heads in parallel via the diagnosis analog route.
申请公布号 JP2002207066(A) 申请公布日期 2002.07.26
申请号 JP20010001957 申请日期 2001.01.09
申请人 ADVANTEST CORP 发明人 KAWABATA MASAYUKI
分类号 G01R31/26;G01R31/28;G01R31/316;G01R31/319;(IPC1-7):G01R31/28 主分类号 G01R31/26
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