发明名称 PUSHER AND ELECTRONIC PART-TESTING APPARATUS WITH THE SAME
摘要 PROBLEM TO BE SOLVED: To test electronic parts without generating damages such as cracks, chips or the like to the electronic parts by connecting contacts of the electronic parts to connecting terminals of sockets without applying a load concentratedly to a part where an adhering substance adheres even when the adhering substance such as a particle or the like adheres to faces to be pressed of the electronic parts. SOLUTION: A sharpened projecting part 312 is set to a face 311 of a pusher block 31 which is opposite to the face 211 to be pressed of a body part 21 of an IC chip 2.
申请公布号 JP2002207063(A) 申请公布日期 2002.07.26
申请号 JP20010001934 申请日期 2001.01.09
申请人 ADVANTEST CORP 发明人 ONODERA KEIICHI
分类号 G01R31/26;G01R1/04;G01R31/01;H01L21/66;(IPC1-7):G01R31/26 主分类号 G01R31/26
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