发明名称 APPARATUS AND METHOD FOR MEASURING SPATIALLY VARYING BIDIRECTIONAL REFLECTANCE DISTRIBUTION FUNCTION
摘要 <p>An apparatus and method for measuring spatially varying bidirectional reflectance distribution function and method are provided. The apparatus and method provide means to illuminate different areas of a sample (60) at different angles of incidence and detect the angular variation of radiation emitted from the sample in response to the illumination. The apparatus includes a paraboloidal reflector (50) for delivering the illumination and receiving the radiation emitted by the sample, a radiation source (20) for generating a beam of collimated radiation, a beam steering device (70) for controlling the angle of incidence with which the focused cone of light strikes the sample, and a detector (90) to receive the collected light from the reflector.</p>
申请公布号 WO2002057726(A2) 申请公布日期 2002.07.25
申请号 US2001043729 申请日期 2001.11.14
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