METHOD FOR TESTING MARKING FLAW OF SEMICONDUCTOR PRODUCT BY OPTICAL CHARACTER RECOGNITION

摘要

PURPOSE: A method for testing marking flaw of semiconductor product by optical character recognition is provided to test marking flaw by directly reading marking character as character string. CONSTITUTION: A method includes the steps of: a step(21) inputting marking characters as character strings in an input device; a step(22) storing the input character strings in a memory as test reference value; a step(23) reading marking characters marked on a semiconductor product as character images by a reading device; a step(24,25) recognizing the read character images as character strings in an optical character recognizing device and getting character string data; and a step(26,27) comparing the character string data with the character strings of the test reference value in a calculation processing device for determining whether the marking is good or bad.