| 摘要 |
<p>A particle characterisation apparatus (10) (figure 1) comprises a test cell (12) arranged to contain a sample, or test medium, (14) and an optical radiation source (16) aligned so that it emits radiation directed to be incident on the test medium (14). The optical radiation incident on the test medium (14) is scattered and the scattered components are collected by optical waveguides (18) having collecting terminations (20) radially disposed about the test cell (12) at predetermined angular positions. The collected optical radiation is carried by the waveguides from the test cell and emitted through radiation emitting terminations (24) into detection means (22). The detection means (22) comprises detectors (28) mounted on a rotatable carrier (30) and disposed in alignment with the radiation emitting terminations to detect the optical radiation being emitted therefrom. In use, each detector (28) is rotated to sequentially detect the radiation emitted from each emitting termination (24) in turn.</p> |
