| 摘要 |
PURPOSE: To provide a test system for an address multiplexer memory with a serial access function in which an input cycle is simplified. CONSTITUTION: This test system for an address multiplexer memory with a serial access function comprises memory cell arrays (13) having a plurality of memory cells storing a plurality of data, a command control section (15) to which a plurality of commands are inputted and which controls a command so that an inputted command is held and input of a command is refused in a test mode in which a test of a memory cell is performed, an address control section (16) to which a plurality of addresses are inputted and which controls an address so that an inputted address is held and input of an address is refused in a test mode, and a storage section (17) reading out continuously a plurality of data based on a command outputted from the command control section (15) and an address outputted from the address control section (16).
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