| 摘要 |
To provide a semiconductor integrated circuit having a redundancy-relieved data output function which can carry out a pass/fail test of a selecting operation of a redundancy-relieved output selecting circuit for redundancy-relieved output data. Data inputs D of scan flip-flops SFFC <i+3>, SFFC <i+2>, SFFC <i+1> and SFFC <i> are connected to redundancy-relieved output data XDO <i+3>, XDO <i+2>, XDO <i+1> and XDO <i> in place of output data DO <i+3>, DO <i+2>, DO <i+1> and DO <i> of a conventional RAM 211, respectively. An AND gate 21 receives a serial output SO <i+4> at one of inputs and receives a selector test signal PFIN at the other input, and an output thereof is sent to the other input of an AND gate 223. AND gates 221 to 223 to be connected in series receive serial outputs SO <i+1> to SO <i+3> of the SFFC <i+1> to the SFFC <i+3> at inputs, respectively.
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