| 摘要 |
A semiconductor storage device includes a redundancy circuit, which replaces a defective memory cell with a redundancy memory cell. The semiconductor storage device further includes a charge pump used for programming redundancy information by performing dielectric breakdown selectively to a capacity. In addition, a redundancy control circuit included in the semiconductor storage device supplies a fixed charge to the capacity, and refreshes the capacity, thereby reproducing the redundancy information programmed by use of the charge pump. Additionally, the redundancy control unit supplies the redundancy information to a redundancy circuit.
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