发明名称 System for analyzing trace amounts of impurities in gases
摘要 An analyzing apparatus for assaying various kinds of trace impurity contents in various kinds of high-purity gases, having an atmospheric pressure ionization mass spectrometer useful for determination of trace impurity contents in such high-purity gases on the ppb to sub ppb levels and a gas chromatograph integrated therewith, enabling high efficiency determination of trace impurity contents in high-purity gases. The analyzing apparatus having a gas chromatograph (8) and an atmospheric pressure ionization mass spectrometer (6), is provided with a system (10) for introducing a sample gas introduced from a sample gas introduction source directly to the atmospheric pressure ionization mass spectrometer (6); a system (14a, 14b) for introducing the sample gas via the gas chromatograph (8) to the atmospheric pressure ionization mass spectrometer (6); and a channel selector (11, 13, 15) for changing over the channel of the sample gas to either of these two systems.
申请公布号 US6418781(B1) 申请公布日期 2002.07.16
申请号 US19990445413 申请日期 1999.12.08
申请人 NIPPON SANSO CORPORATION 发明人 NISHINA AKIRA;KIKUCHI TSUTOMU;TANAKA MAKOTO;YOSHIDA HIDETOSHI;KIMIJIMA TETSUYA
分类号 G01N27/62;G01N30/72;G01N33/00;(IPC1-7):B01D15/08;F16K31/02;H01J49/40;G01N30/02 主分类号 G01N27/62
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