发明名称 MANUFACTURING METHOD FOR RAISED SOURCE/DRAIN(S/D) REGION IN DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a manufacturing method for self-aligned raised source/drain(S/D) regions. SOLUTION: The manufacturing method has a process for forming on a substrate a first insulation layer having a gate opening portion and source/drain opening portions adjacent to the gate opening portion; a process for forming a gate dielectric layer on the substrate present in the gate opening portion; a process for so forming a doped conductive layer with a dopant as to fill it into the gate and source/drain opening portions; a process for so flattening the doped conductive layer as to make the level of its top surface equal to the one of the first insulation layer; a process for so filling the gate opening portion with the doped conductive layer as to form a gate on the gate dielectric layer; a process for so filling the source/drain opening portions with the doped conductive layer as to form raised source/ drain regions; a process for so removing spacer portions present between the gate and the raised source/drain regions as to form spacer opening portions; a process for forming LDD regions in the substrate present inside the spacer opening portions by an ion implantation, etc., a process for so forming a dielectric layer on the substrate as to fill the spacer opening portions with it; and a process for so diffusing the dopant from the raised source/drain regions by a thermal cycle, etc., as to form source/drain regions in the substrate present just below the raised source/drain regions.
申请公布号 JP2002198517(A) 申请公布日期 2002.07.12
申请号 JP20010346128 申请日期 2001.11.12
申请人 CHARTERED SEMICONDUCTOR MANUFACTURING INC 发明人 PAN YANG;LEE JAMES YONG MENG;LEUNG YING KEUNG;PRADEEP YELEHANKA RAMACHANDRAMURTHY;ZHENG JIA ZHEN;RAP CHAN;QUEK ELGIN;SUNDARESAN RAVI
分类号 H01L29/78;H01L21/225;H01L21/336;(IPC1-7):H01L29/78 主分类号 H01L29/78
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