发明名称 Method for independent control of polycrystalline silicon-germanium in a silicon-germanium HBT and related structure
摘要 In one embodiment a precursor gas for growing a polycrystalline silicon-germanium region and a single crystal silicon-germanium region is supplied. The precursor gas can be, for example, GeH4. The polycrystalline silicon-germanium region can be, for example, a base contact in a heterojunction bipolar transistor while the single crystal silicon-germanium region can be, for example, a base in the heterojunction bipolar transistor. The polycrystalline silicon-germanium region can be grown in a mass controlled mode at a certain temperature and a certain pressure of the precursor gas while the single crystal silicon-germanium region can be grown, concurrently, in a kinetically controlled mode at the same temperature and the same pressure of the precursor gas. The disclosed embodiments result in controlling the growth of the polycrystalline silicon-germanium independent of the growth of the single crystal silicon-germanium.
申请公布号 US2002090788(A1) 申请公布日期 2002.07.11
申请号 US20020054438 申请日期 2002.01.22
申请人 CONEXANT SYSTEMS, INC. 发明人 U'REN GREGORY D.
分类号 H01L21/20;H01L21/331;(IPC1-7):H01L21/331;H01L21/822 主分类号 H01L21/20
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