| 摘要 |
The invention relates to a method of flour analysis, for determining a baking property thereof, comprising the steps of test baking flour from a number of flour samples to obtain bread, and measuring at least one property of the bread obtained from each flour sample, measuring the reflectance for each flour sample at a plurality of wave lengths in the wave length range 400 - 2500 nm. The reflectance data for each flour sample are stored. Multivariate analysis is used to create a calibrated model of the relation between the NIR spectrum and the measured property of said bread obtained from each respective flour sample. The multivariate analysis comprises Partial Least Squares Regression, and an exclusion of wavelengths the reflectance values of which do not contain any significant information about bread volume. The baking property for a bread baked from an unknown flour, is predicted by using said calibrated model. |
