| 摘要 |
PROBLEM TO BE SOLVED: To provide an IC measurement device requiring little time for measuring output timing SKEW of a measured IC. SOLUTION: This IC measurement device is provided with a timing generator outputting a strobe pulse S21 synchronized with a test cycle, delay means BUF1-4 sequentially delaying the strobe pulse S21 for outputting a plurality of strobe pulses mutually different in an edge time, a retaining means FF1-5 retaining data strobes or data conditions at a plurality of times inside a single test cycle on the basis of a plurality of strobe pulses, and a detecting means detecting timing of change in the data strobe or the data condition on the basis of the data strobes or the data conditions at a plurality of times.
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