发明名称 Nonvolatile semiconductor memory device with high impurity concentration under field oxide layer
摘要 Flash type programmable nonvolatile memory unit cells are provided, along with a manufacturing method. Each unit cell is formed such that the interpoly dielectric layer and the control gate surround the top surface and also the four lateral surfaces of the floating gate. This increases the capacitance between the floating gate and the control gate, which improves a coupling ratio. This also improves electromagnetic shielding within each cell, which reduces cross talk between neighboring cells, and permits more dense integration.
申请公布号 US6417538(B1) 申请公布日期 2002.07.09
申请号 US19990360843 申请日期 1999.07.22
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHOI JEONG-HYUK
分类号 H01L21/8247;H01L27/115;H01L29/423;H01L29/788;H01L29/792;(IPC1-7):H01L29/788 主分类号 H01L21/8247
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