发明名称 BASE STATION RADIO PERFORMANCE TESTING APPARATUS AND METHOD BY FULLY AUTOMATING TESTING ENVIRONMENT
摘要 <p>PURPOSE: A base station radio performance testing apparatus and method by fully automating a testing environment is provided to optimize a mobile communication system and improve its performance by automatically constructing a testing environment similar to an actual environment in which a radio channel is changed, a terminal is moved and a radio communication channel is formed between the terminal and a base station, and performing a base station radio performance testing of a mobile communication system. CONSTITUTION: A controller(10) generates a data for testing a base station radio performance. The first and the second base stations(21,22) process the data generated from the controller(10) by corresponding paths. A channel simulation unit(30) sets and controls a state of various testing instruments according to an analysis/control unit and makes a data output from the first and the second base stations(21,22) like a signal of an actual environment. An analysis/control unit(40) automatically constructs a testing environment by controlling a state of the first and second base stations(21,22), the terminal and an attenuator and the plurality of testing instruments of the channel simulation unit(30) according to an analysis/control program, performs a base station radio performance testing, collects and analyzes the data output from the controller(10), the first and second base stations(21,22) and the terminal according to the base station radio performance testing, and outputs a base station radio performance testing result. A terminal monitoring unit(50) monitors a state of the terminal and outputs the monitoring result to the analysis/control unit(40) in case that the signal of the base station after passing the attenuator of the channel simulation unit(30) is output to the terminal operated under the control of the analysis/control unit(40).</p>
申请公布号 KR20020054019(A) 申请公布日期 2002.07.06
申请号 KR20000082498 申请日期 2000.12.27
申请人 HYNIX SEMICONDUCTOR INC. 发明人 WOO, SEUNG WON
分类号 H04B17/40;(IPC1-7):H04B17/02 主分类号 H04B17/40
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