发明名称 METHOD FOR FORMING INSULATING LAYER OF SEMICONDUCTOR DEVICE
摘要 PURPOSE: A method for forming an insulating layer of a semiconductor device is provided to improve the planarization of an insulating layer by generating compressive and tensile power to a wafer. CONSTITUTION: An interlayer dielectric(2) is formed on a semiconductor substrate(1). At this time, a PETEOS layer having compressive and tensile power is used as the interlayer dielectric(2). Also, processing conditions, such as LF power, deposition temperature or pressure of a chamber, are controlled. The surface of the PETEOS layer(2) is then planarized by CMP(Chemical Mechanical Polishing) using a polishing unit(3).
申请公布号 KR20020052684(A) 申请公布日期 2002.07.04
申请号 KR20000082112 申请日期 2000.12.26
申请人 HYNIX SEMICONDUCTOR INC. 发明人 YOON, IL YEONG
分类号 H01L21/3105;(IPC1-7):H01L21/310 主分类号 H01L21/3105
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