| 摘要 |
An objective of this invention is to provide a process for manufacturing a shared contact without protrusion toward an adjacent gate electrode and an improved shared contact. This invention allows a shared contact without protrusion from the gate electrode to be prepared by removing a gate electrode which is in contact with a dopant diffusion layer but is not used as a transistor element and forming a shared contact in the area. As a result, a cell size is larger in an SRAM according to this invention than in that according to the prior art.
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