发明名称 |
Eddy current inspection method and apparatus for detecting flaws in an electrically conductive component |
摘要 |
A method of inspecting a preselected area of an electrically conductive component to determine whether flaws are present. The method includes the steps of permanently mounting an eddy current element on the component over the preselected area and energizing the element to generate alternating magnetic fields proximate the component. An electrical signal generated by a secondary magnetic field formed proximate the component is detected using the element and the detected electrical signal is compared to a reference signal to determine whether the detected signal is different than the reference signal. Differences indicate the presence of a flaw in the component. Inspection apparatus for performing this method is also disclosed.
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申请公布号 |
US6414483(B1) |
申请公布日期 |
2002.07.02 |
申请号 |
US20000627049 |
申请日期 |
2000.07.27 |
申请人 |
GENERAL ELECTRIC COMPANY |
发明人 |
NATH SHRIDHAR CHAMPAKNATH;BATZINGER THOMAS JAMES;ROSE CURTIS WAYNE;STRYJEK PAUL PETER |
分类号 |
G01N27/90;(IPC1-7):G01N27/82 |
主分类号 |
G01N27/90 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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