发明名称 |
APPARATUS AND METHOD FOR PROCESSING PLASMA TO GLASS SUBSTRATE |
摘要 |
PROBLEM TO BE SOLVED: To provide an apparatus and a method for processing plasma capable of continuously etching source and drain electrodes and a doped layer at a high etching rate and with little damage to the middle of a channel layer in the same etching chamber. SOLUTION: The state of plasma for etching is changed between the state that the metal laminated film layer of a substrate to be processed is etched and the state that layers after a silicon layer containing impurities are etched to thereby perform the two etching in one vacuum chamber.
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申请公布号 |
JP2002184760(A) |
申请公布日期 |
2002.06.28 |
申请号 |
JP20000380502 |
申请日期 |
2000.12.14 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
YANAGI YOSHIHIRO;KIMURA TEIICHI;TAKAGI KIYOHIKO;HOUCHIN RIYUUZOU |
分类号 |
H01L21/302;H01L21/3065;H01L21/336;H01L29/786;(IPC1-7):H01L21/306 |
主分类号 |
H01L21/302 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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