发明名称 APPARATUS AND METHOD FOR PROCESSING PLASMA TO GLASS SUBSTRATE
摘要 PROBLEM TO BE SOLVED: To provide an apparatus and a method for processing plasma capable of continuously etching source and drain electrodes and a doped layer at a high etching rate and with little damage to the middle of a channel layer in the same etching chamber. SOLUTION: The state of plasma for etching is changed between the state that the metal laminated film layer of a substrate to be processed is etched and the state that layers after a silicon layer containing impurities are etched to thereby perform the two etching in one vacuum chamber.
申请公布号 JP2002184760(A) 申请公布日期 2002.06.28
申请号 JP20000380502 申请日期 2000.12.14
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 YANAGI YOSHIHIRO;KIMURA TEIICHI;TAKAGI KIYOHIKO;HOUCHIN RIYUUZOU
分类号 H01L21/302;H01L21/3065;H01L21/336;H01L29/786;(IPC1-7):H01L21/306 主分类号 H01L21/302
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