发明名称 PLASMA ETCHING DEVICE AND METHOD FOR MANUFACTURING THE SAME
摘要 PURPOSE: A plasma etching device and a method for manufacturing the same are provided to assure a uniform etching rate on an overall surface of a semiconductor wafer. CONSTITUTION: After mounting a semiconductor wafer(10) on a lower electrode(14), an annular focusing ring(30) is disposed along the outer edge of the wafer(10). The annular focusing ring(30) comprises a first ring(32), a second ring(34) and a third ring(36). The first ring(32) made of a quartz is disposed at the outermost peripheral side. The second ring(34) made of a silicon is disposed at an inside of the ring(32). The third ring(36) is disposed at the innermost peripheral side so as to be superposed with the peripheral edge of the wafer(10). The third ring(36) is composed of a material, indicating a slow temperature rise as compared to the silicon during executing of the plasma etching.
申请公布号 KR20020050696(A) 申请公布日期 2002.06.27
申请号 KR20010048889 申请日期 2001.08.14
申请人 SEMICONDUCTOR LEADING EDGE TECHNOLOGIES, INC. 发明人 KIM, BYONG DONG
分类号 H01L21/302;H01L21/3065;(IPC1-7):H01L21/306 主分类号 H01L21/302
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