AMORPHIZATION OF SUBSTRATE TO PREVENT SILICIDE ENCROACHMENT INTO CHANNEL REGION OF FIELD EFFECT TRANSISTOR
摘要
A MOSFET includes silicided source/drain terminals (106) and a substantially metal-free channel region (112), wherein the metal is characterized in that it diffuses more easily into the material of the substrate which contains the source/drain terminals (106) than the material of the substrate diffuses into the metal. In a further aspect of the present invention, a portion of the source/drain terminals (106) of a MOSFET are converted to an amorphous material (122) prior to being reacted with a metal.
申请公布号
WO0036634(A3)
申请公布日期
2002.06.27
申请号
WO1999US26865
申请日期
1999.11.12
申请人
INTEL CORPORATION;BAI, GANG;JACOB, PAULINE, N.;JAN, CHIA-HONG;TSAI, JULIE, A.
发明人
BAI, GANG;JACOB, PAULINE, N.;JAN, CHIA-HONG;TSAI, JULIE, A.