发明名称 AMORPHIZATION OF SUBSTRATE TO PREVENT SILICIDE ENCROACHMENT INTO CHANNEL REGION OF FIELD EFFECT TRANSISTOR
摘要 A MOSFET includes silicided source/drain terminals (106) and a substantially metal-free channel region (112), wherein the metal is characterized in that it diffuses more easily into the material of the substrate which contains the source/drain terminals (106) than the material of the substrate diffuses into the metal. In a further aspect of the present invention, a portion of the source/drain terminals (106) of a MOSFET are converted to an amorphous material (122) prior to being reacted with a metal.
申请公布号 WO0036634(A3) 申请公布日期 2002.06.27
申请号 WO1999US26865 申请日期 1999.11.12
申请人 INTEL CORPORATION;BAI, GANG;JACOB, PAULINE, N.;JAN, CHIA-HONG;TSAI, JULIE, A. 发明人 BAI, GANG;JACOB, PAULINE, N.;JAN, CHIA-HONG;TSAI, JULIE, A.
分类号 H01L21/28;H01L21/265;H01L21/285;H01L21/336;H01L29/417;H01L29/78;(IPC1-7):H01L29/76 主分类号 H01L21/28
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