发明名称 SURFACE PLASMON RESONANCE MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To allow a surface plasmon resonance measuring apparatus to obtain a light detection signal with a high S/N even if light beams are caused to impinge on the interface between a dielectric block and a metallic film while their incident angle is fixed. SOLUTION: The surface plasmon resonance measuring apparatus comprises dielectric blocks 11 and 13; a metallic film 14 formed on one side of each of the dielectric blocks 11 and 13 and brought into contact with a sample 15; light sources 16 and 17 emitting two or more light beams L1 and L2 with different wavelengths; and an incident optical system 18 meeting the requirement for total reflection at the interface 13a between each of the blocks 11 and 13 and the metallic film 14 and causing the beams to impinge at the same position on the interface 13a at the fixed incident angle included in the requirement for surface plasmon resonance. The strength of the light beam L totally reflected by the interface 13a is measured by light detection means 21 and 22 for each wavelength, and light detection signals S1 and S2 as to the two light beams L1 and L2 with different wavelengths, outputted by the light detection means 21 and 22, are input to a computing means 23 to calculate their difference.
申请公布号 JP2002181700(A) 申请公布日期 2002.06.26
申请号 JP20000379897 申请日期 2000.12.14
申请人 FUJI PHOTO FILM CO LTD 发明人 NAYA MASAYUKI
分类号 G01N21/27;(IPC1-7):G01N21/27 主分类号 G01N21/27
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