发明名称 COMPLEMENTARY-METAL-OXIDE-SEMICONDUCTOR IMAGE SENSOR
摘要 PURPOSE: A complementary-metal-oxide-semiconductor(MOS) image sensor is provided to prevent the quality of an image from being deteriorated by noise, by making a photodiode n+ region control electrons generated by the heat on the surface of a photodiode region so that the electrons are prevented from being recombined or migrating to a photodiode n region. CONSTITUTION: Transfer gates(36) are formed on a semiconductor substrate(31). Photodiode n regions(33) are positioned in the first depth at one side of the transfer gates, separated from the transfer gates by a predetermined interval. Photodiode surface p regions(34) has an interface of the same area as the photodiode n region, corresponding to the photodiode n region and having the second depth shallower than the first depth. Photodiode n+ regions(38) are positioned in the second depth in a portion where a photodiode surface p region is separated from the transfer gate. Floating regions are formed at the other side of the transfer gates.
申请公布号 KR20020049860(A) 申请公布日期 2002.06.26
申请号 KR20000079168 申请日期 2000.12.20
申请人 CEVIT I.S. INC. 发明人 PARK, YONG
分类号 H01L27/14;(IPC1-7):H01L27/14 主分类号 H01L27/14
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