发明名称 Dual-hardness polishing pad for linear polisher and method for fabrication
摘要 A composite, dual-hardness polishing pad for use in a linear chemical mechanical polishing apparatus and a method for forming the pad are described. In the composite, dual-hardness polishing pad, a pad body is first provided which has a leading edge and a trailing edge for mounting to a linear belt immediately adjacent to a second polishing pad. The pad body is fabricated of a material that has a first hardness, the leading edge contacts an object being polished on the composite polishing pad before the trailing edge when the linear belt turns in a linear polishing process. The composite polishing pad further includes a buffer pad that is adhesively joined to the leading edge of the pad body for contacting the object that is being polished, the buffer pad may be fabricated of a material that has a second hardness which is at least 20% smaller than the first hardness such that impact on the object being polished is minimized during a linear polishing process. The present invention is further directed to a method for adhesively joining a buffer pad to a pad body of a polishing pad.
申请公布号 US6409587(B1) 申请公布日期 2002.06.25
申请号 US20000713827 申请日期 2000.11.15
申请人 TAIWAN SEMICONDUCTOR MANUFACTURING CO., LTD 发明人 SHIH TSU;JANG SYUN-MING;CHEN YING-HO;CHIOU WEN-CHIH
分类号 H04N7/30;B24B21/04;B24D11/08;G06F17/14;G06T9/00;H03M7/30;H04N1/41;(IPC1-7):B24D11/00 主分类号 H04N7/30
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