发明名称 |
METHOD FOR PRODUCING SUBSTRATE FOR DISPLAY |
摘要 |
<p>PROBLEM TO BE SOLVED: To solve the problems of five-mask-process for channel etching TFT that overetching takes place on the drain electrode at the time of forming an opening, the characteristics of a transistor are susceptible to deterioration through formation of a passivation insulation layer, the production process is long and the process cost is not reduced. SOLUTION: A source line and a drain line are formed by depositing a heat resistant metal and an aluminum alloy which can be anodized. A passivation insulation layer is eliminated by anodizing the surface of these lines and converting an amorphous silicon layer containing impurities into a silicon oxide layer utilizing a photomask. A process for making insular a semiconductor layer and a process for forming an opening are rationalized by forming an extra insulation layer on an exposed scanning line.</p> |
申请公布号 |
JP2002176062(A) |
申请公布日期 |
2002.06.21 |
申请号 |
JP20010263785 |
申请日期 |
2001.08.31 |
申请人 |
MATSUSHITA ELECTRIC IND CO LTD |
发明人 |
KAWASAKI KIYOHIRO |
分类号 |
G02F1/1362;G02F1/1368;G09F9/30;H01L21/28;H01L21/3205;H01L21/336;H01L23/52;H01L29/786;(IPC1-7):H01L21/336;G02F1/136;H01L21/320 |
主分类号 |
G02F1/1362 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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