发明名称 |
Method and system for detecting an outlying resistance in a plurality of resistive elements |
摘要 |
In one aspect of the invention, a semiconductor die includes a plurality of resistive elements operable to receive a voltage differential between at least two of the resistive elements. The semiconductor die also includes a test circuit coupled to at least three tap points along the resistive elements. The test circuit is operable to measure a voltage at at least two of the tap points. A difference in the voltages between the at least two tap points is proportional to a resistance of the one or more resistive elements between the at least two tap points.
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申请公布号 |
US2002078409(A1) |
申请公布日期 |
2002.06.20 |
申请号 |
US20010011220 |
申请日期 |
2001.10.25 |
申请人 |
MARSHALL ANDREW;BURGESS C. KEITH;WEINBERGER CHARLES D.;SAYALA MADHU |
发明人 |
MARSHALL ANDREW;BURGESS C. KEITH;WEINBERGER CHARLES D.;SAYALA MADHU |
分类号 |
G01R31/28;(IPC1-7):G01R31/28 |
主分类号 |
G01R31/28 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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