发明名称 Complementary transistors having respective gates formed from a metal and a corresponding metal-silicide
摘要 A method of forming a first and second transistor. The method provides a semiconductor surface (20). The method also forms a gate dielectric (30) adjacent the semiconductor surface. Further, the method forms a first transistor gate electrode (902) comprising a metal portion (402) in a fixed relationship with respect to the gate dielectric. Still further, the method forms a second transistor gate electrode (901) comprising a silicide (701) of the metal portion in a fixed relationship with respect to the gate dielectric.
申请公布号 US2002076886(A1) 申请公布日期 2002.06.20
申请号 US20010998068 申请日期 2001.11.30
申请人 ROTONDARO ANTONIO L.P.;VISOKAY MARK R. 发明人 ROTONDARO ANTONIO L.P.;VISOKAY MARK R.
分类号 H01L21/28;H01L21/8238;H01L27/092;H01L29/423;H01L29/43;H01L29/49;(IPC1-7):H01L21/823;H01L21/823;H01L21/336 主分类号 H01L21/28
代理机构 代理人
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