发明名称 TWO-DIMENSIONAL SCANNING INFRARED TEMPERATURE MEASURING APPARATUS
摘要 PROBLEM TO BE SOLVED: To obtain a two-dimensional scanning infrared temperature measuring apparatus in which high speed two-dimensional scanning is achieved, while reducing the occupancy area. SOLUTION: Repeating turning bodies 8 and 14 centered about XY axes, having origin at the center of a hole 2 made in the top plate of a trapezoidal protrusion 1 on the wall face of a microwave oven are coupled, an infrared element 20 is fixed to one repeating turning body in the direction toward the origin and wires being connected with an electronic circuit are shielded. High speed is achieved through making it light in weight, while reducing the occupancy area.
申请公布号 JP2002168698(A) 申请公布日期 2002.06.14
申请号 JP20000368050 申请日期 2000.12.04
申请人 MATSUSHITA ELECTRIC IND CO LTD 发明人 MATSUSHIMA HARUO
分类号 G01J5/00;F24C7/02;G01J5/14;G01J5/48;H05B6/68;(IPC1-7):G01J5/00 主分类号 G01J5/00
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