发明名称 Method for manufacturing a semiconductor device
摘要 The invention provides a method for manufacturing a semiconductor device for preventing the low bonding strength reliability in flip tip mounting of a semiconductor chip on an organic substrate. In the thermal hardening process for hardening the under fill resin filled between a semiconductor chip and organic substrate. The thermal expansion due to rapid heating of an organic substrate is mitigated by applying multi-step heating process in which under fill resin is heated at a temperature T1 lower than the hardening temperature T2 of the under fill resin for a predetermined time.
申请公布号 US2002072149(A1) 申请公布日期 2002.06.13
申请号 US20010966942 申请日期 2001.09.28
申请人 YOSHIDA KOJI 发明人 YOSHIDA KOJI
分类号 H01L21/60;H01L21/56;(IPC1-7):H01L21/44;H01L21/48;H01L21/50 主分类号 H01L21/60
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