发明名称 Controlled anneal conductors for integrated circuit interconnects
摘要 A method is provided for manufacturing an integrated circuit on a semiconductor wafer having a semiconductor substrate with a semiconductor device thereon. A dielectric layer is formed on the semiconductor substrate and an opening is formed in the dielectric layer. A barrier layer is deposited to line the opening. A seed layer is deposited on the barrier layer and securely bonds to the barrier layer. A conductor layer is deposited to fill the channel opening over the barrier layer. A planarization technique is used to planarize the barrier, seed layer, and conductor layers to be coplanar with the dielectric layer to form a conductor channel. The semiconductor wafer is then subjected to a two step timed anneal.
申请公布号 US6403474(B1) 申请公布日期 2002.06.11
申请号 US20000745917 申请日期 2000.12.20
申请人 ADVANCED MICRO DEVICES, INC. 发明人 AVANZINO STEVEN C.;WANG PIN-CHIN CONNIE;NGO MINH VAN
分类号 H01L21/288;H01L21/768;(IPC1-7):H01L21/44 主分类号 H01L21/288
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