| 摘要 |
A fluorescent X-ray analysis method comprises examining a positional relationship between an image of a sample and an X-ray illuminated region of the sample image, acquiring an image of the sample as a monochromatic image, extracting from the acquired sample image a coincident portion thereof containing the X-ray illuminated region, and examining a luminance change in the extracted image and, where there is a luminance change greater than a reference value, determining whether or not the X-ray illuminated to the sample is partly off the sample.
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