发明名称 Mask for electron beam projection lithography and method of fabricating the same
摘要 In an electron beam projection lithography mask comprising a first silicon substrate (23) on which a transfer pattern is formed and a second silicon substrate (21) of a pillar side which is stuck on the first silicon substrate (23), slits (25) are formed in the first silicon substrate (23) positioned on pillar areas (21a) of the second silicon substrate (21).
申请公布号 US2002066870(A1) 申请公布日期 2002.06.06
申请号 US20010996733 申请日期 2001.11.30
申请人 KOBA FUMIHIRO 发明人 KOBA FUMIHIRO
分类号 B81C1/00;G03F1/16;G03F1/20;H01L21/027;(IPC1-7):G21K5/10 主分类号 B81C1/00
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