发明名称 Method of making floating gate non-volatile memory cell with low erasing voltage
摘要 A non-volatile memory cell of the type which includes at least one floating gate transistor and which is realized over a semiconductor substrate includes a source region, and a drain region, separated by a channel region which is overlaid by a thin layer of gate oxide. The gate oxide isolates a floating gate region from the substrate. The floating gate region is coupled to a control gate terminal. The floating gate region of the memory cell develops a first potential barrier between the semiconductor substrate and the gate oxide layer, and a second different potential barrier between the floating gate region and the gate oxide.
申请公布号 US6399444(B1) 申请公布日期 2002.06.04
申请号 US20000521876 申请日期 2000.03.08
申请人 SGS-THOMSON MICROELECTRONICS S.R.L. 发明人 CAPPELLETTI PAOLO
分类号 H01L21/8247;H01L21/28;H01L27/115;H01L29/423;H01L29/49;H01L29/51;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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