发明名称 Method for producing a DRAM cell with a trench capacitor
摘要 The present invention provides a method for fabricating a DRAM cell having a trench capacitor. In order to simplify the fabrication method for a DRAM cell, to ensure a high yield and to achieve a high packing density of the DRAM cells, the invention proposes that the storage capacitor (4) of the DRAM cell and the selection transistor (3) be fabricated independently of one another. This saves method steps which, in the prior art, have to be carried out in order to isolate capacitor (9) and gate (16) in the same trench.
申请公布号 US6399435(B1) 申请公布日期 2002.06.04
申请号 US20010913422 申请日期 2001.10.15
申请人 INFINEON TECHNOLOGIES AG 发明人 TIHANYI JENOE
分类号 H01L21/8242;H01L27/108;(IPC1-7):H01L21/824 主分类号 H01L21/8242
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