发明名称 Method of silicide formation by silicon pretreatment
摘要 Various methods of fabricating a silicide film and structures incorporating the same are provided. In one aspect, a method of fabricating a silicide film is provided that includes providing a silicon surface and etching the silicon surface at between isotropic and anisotropic etching conditions to define a plurality of oblique surfaces thereon and thereby increase the surface area of the silicon surface. A silicide-forming material is deposited on the plurality of oblique surfaces and the silicon surface is heated to react the silicide-forming material therewith and form silicide. The roughing of the silicon surface facilitates metal-silicide reactions.
申请公布号 US6399493(B1) 申请公布日期 2002.06.04
申请号 US20010860141 申请日期 2001.05.17
申请人 ADVANCED MICRO DEVICES, INC. 发明人 DAWSON ROBERT;CHEEK JON D.;PELLERIN JOHN G.
分类号 H01L21/285;H01L21/336;(IPC1-7):H01L21/44 主分类号 H01L21/285
代理机构 代理人
主权项
地址