发明名称 Non-contact type atomic microscope and observation method using it
摘要 A non-contact type atomic microscope comprises a plurality of probes differing in resonance frequency; an actuator for vibrating the plurality of probes simultaneously; and a drive signal generating circuit for generating a drive signal for the actuator containing a resonance frequency of each of the plurality of probes. An observation method for observing a surface shape of a sample by using a plurality of probes comprises a step of vibrating the plurality of probes at simultaneously with a common actuator in a vicinity of their resonance frequencies; wherein a signal for driving the actuator contains a resonance frequency of each of the probes; a step of detecting any displacement in each of the probes and generating an output signal; and a step of generating a signal representing the surface shape based on the output signal.
申请公布号 US2002063213(A1) 申请公布日期 2002.05.30
申请号 US20010993671 申请日期 2001.11.27
申请人 ITSUJI TAKEAKI;SHIDO SHUNICHI 发明人 ITSUJI TAKEAKI;SHIDO SHUNICHI
分类号 G01Q60/24;G01N23/20;G01Q60/32;G01Q60/38;G01Q70/06;(IPC1-7):G01N23/00 主分类号 G01Q60/24
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