发明名称 |
Non-contact type atomic microscope and observation method using it |
摘要 |
A non-contact type atomic microscope comprises a plurality of probes differing in resonance frequency; an actuator for vibrating the plurality of probes simultaneously; and a drive signal generating circuit for generating a drive signal for the actuator containing a resonance frequency of each of the plurality of probes. An observation method for observing a surface shape of a sample by using a plurality of probes comprises a step of vibrating the plurality of probes at simultaneously with a common actuator in a vicinity of their resonance frequencies; wherein a signal for driving the actuator contains a resonance frequency of each of the probes; a step of detecting any displacement in each of the probes and generating an output signal; and a step of generating a signal representing the surface shape based on the output signal.
|
申请公布号 |
US2002063213(A1) |
申请公布日期 |
2002.05.30 |
申请号 |
US20010993671 |
申请日期 |
2001.11.27 |
申请人 |
ITSUJI TAKEAKI;SHIDO SHUNICHI |
发明人 |
ITSUJI TAKEAKI;SHIDO SHUNICHI |
分类号 |
G01Q60/24;G01N23/20;G01Q60/32;G01Q60/38;G01Q70/06;(IPC1-7):G01N23/00 |
主分类号 |
G01Q60/24 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|