METHOD FOR GENERATING LIBRARY FOR RELIABILITY VERIFICATION

摘要

PROBLEM TO BE SOLVED: To provide a library generating method for generating a library for reliability verification with improved library precision of EM and HC elements. SOLUTION: When the reliability of an LSI is verified, a library of electromigration(EM) elements and a library of hot carrier(HC) elements are generated and merged to obtain a frequency limitation table of the EM elements plus the HC elements. This library generating method for reliability verification is characterized in that the library of the EM elements is generated by taking account of all contact elements regarding the EM elements in the cell of the LSI and the library of the HC elements is generated by taking account of all NMOS transistors regarding the HC elements in the cell of the LSI.