发明名称 |
Half tone type phase shift mask blank manufacturing method for photolithography, involves implementing thermal treatment of translucent film at specified temperature |
摘要 |
A thermal treatment of a translucent film is carried out at a 15 deg C after forming the translucent film on a transparent substrate. The translucent film has a thin film of nitrogen, metal and silicon as main components. Independent claims are included for the following: (1) Photo mask manufacturing method; (2) Pattern transcription method; (3) Mask blank; (4) Photo mask; (5) Method of manufacturing half tone type phase shaft mask; and (6) Half tone type shift mask. |
申请公布号 |
DE10144894(A1) |
申请公布日期 |
2002.05.23 |
申请号 |
DE2001144894 |
申请日期 |
2001.09.12 |
申请人 |
HOYA CORP., TOKIO/TOKYO |
发明人 |
NOZAWA, OSAMU;MITSUI, MASARU;MITSUI, HIDEAKI |
分类号 |
B32B17/06;C03C17/22;G03F1/32;G03F1/54;G03F1/68;H01L21/027 |
主分类号 |
B32B17/06 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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