发明名称 METHOD FOR FORMING SILICON QUANTUM DOT AND METHOD FOR FABRICATING NON-VOLATILE MEMORY DEVICE USING THE SAME
摘要 PURPOSE: A method for forming a silicon quantum dot is provided to form a high density silicon quantum dot, by forming an insulation layer by a vapor deposition method after amorphous silicon is seeded and by performing an oxidation process after the amorphous silicon is polished through a chemical mechanical polishing(CMP) process. CONSTITUTION: The first insulation layer is formed on a semiconductor substrate(31). A plurality of nano-crystalline silicon(33) are formed on the first insulation layer. The second insulation layer is formed on the first insulation layer including the nano-crystalline silicon. A part of the second insulation layer and the nano-crystalline silicon is etched. The surface of the nano-crystalline silicon is oxidized.
申请公布号 KR20020038274(A) 申请公布日期 2002.05.23
申请号 KR20000068406 申请日期 2000.11.17
申请人 HYNIX SEMICONDUCTOR INC. 发明人 KIM, IL GWON
分类号 H01L27/10;H01L29/788;(IPC1-7):H01L27/10 主分类号 H01L27/10
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