| 摘要 |
PURPOSE: A semiconductor memory device having an automatic test and repair function and a method thereof are provided, which has a low test cost and a simple test and repair process and uses a redundancy memory optimally. CONSTITUTION: The semiconductor memory device comprises a memory cell array(20), a test circuit(30) and a repair circuit(40). The memory cell array stores data, and comprises a core memory(210) including a number of row lines and a number of column lines and a row redundancy memory(220) including at least one redundancy row line to replace a defective row line and at least one redundancy column line to replace a defective column line. The test circuit applies test data(T_DAT) to the memory cell array, and detects a defective row line and a defective column line. The test circuit includes a row address generation circuit(310), a column address generation circuit(320), a test pattern generation circuit(330), a comparison circuit(340) and a repair judgement circuit(350).
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