发明名称 Method for calibrating a system for measuring contours
摘要 The object of present invention is to provide a sensitivity calibrating method for a detector of a comparator, which enables easy and highly accurate sensitivity calibration for a first and a second detector for measuring opposing position of an object. Heights of two pairs of reference gauge blocks, a first reference gauge block W1 and a second reference gauge block W2, and the second reference gauge block W2 and a third reference gauge block W3 is first measured, and thereafter, sensitivity coefficients for calibrating the sensitivity of an upper detector 10 and a lower detector 20 are calculated by applying the measured value to a predetermined formula. The calculation is repeated three times, and each value is renewed for the upper and the lower detector 10 and 20 respectively. <IMAGE>
申请公布号 EP0887618(A3) 申请公布日期 2002.05.22
申请号 EP19980111616 申请日期 1998.06.24
申请人 MITUTOYO CORPORATION 发明人 TOIDA, YOICHI;HORIKAWA, TOSHIRA
分类号 G01B21/02 主分类号 G01B21/02
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