| 摘要 |
PROBLEM TO BE SOLVED: To reduce a cost required for a test by shortening the time required for the test, and by suppressing increase of a chip area. SOLUTION: A double-input AND gate g104 controlled by a scan enable signal wire n103, for performing a role of interrupting transition of an output signal of g101 is inserted between an output terminal Q of a scan flip-flop g101 with an input switching gate and a logic output signal wire n102.
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