发明名称 FLYING TEST ANALYSIS DEVICE
摘要 PROBLEM TO BE SOLVED: To obtain a flying test analysis device for reducing labor and time required for analysis in the analysis of the result of a flying test, at the same time reducing the missing of problems in terms of guided flying for analysis even without requiring any experience, and improving analysis quality. SOLUTION: The flying test analysis device comprises a first display device 7 for two-dimensionally displaying the flight data of a missile 1; and a second display device 8 for three-dimensionally displaying the missile 1, operating the attitude angle of the missile 9 being three-dimensionally displayed based on the flight data and the steering angle of the steering wing, three- dimensionally displaying a sea surface or ground 11 having a lattice pattern, moving the sea surface or the ground 11 based on the position and speed of the missile, further three-dimensionally displaying a vector 10 with the position of the center of gravity of the missile three-dimensionally displayed as a starting point, and moving the direction and size of the vector 10 based on the acceleration of the missile.
申请公布号 JP2002147997(A) 申请公布日期 2002.05.22
申请号 JP20000337628 申请日期 2000.11.06
申请人 MITSUBISHI ELECTRIC CORP 发明人 FUKUDA KENICHIRO
分类号 F41G9/00;(IPC1-7):F41G9/00 主分类号 F41G9/00
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