发明名称 Method of manufacturing a trench MOSFET using selective growth epitaxy
摘要 A method of creating a thermally grown oxide of any thickness at the bottom of a silicon trench. A dielectric (e.g. oxide) pillar of a predetermined thickness is formed on a semiconductor substrate. A selective epitaxial growth (SEG) process is used to form an epitaxial layer around and over the oxide pillars. A trench is patterned and etched through the SEG layer and in alignment with the oxide pillar such that the trench terminates at the top of the oxide pillar.
申请公布号 US6391699(B1) 申请公布日期 2002.05.21
申请号 US20000586720 申请日期 2000.06.05
申请人 FAIRCHILD SEMICONDUCTOR CORPORATION 发明人 MADSON GORDON K.;SHARP JOELLE
分类号 H01L21/20;H01L21/336;H01L21/8234;H01L29/423;H01L29/78;(IPC1-7):H01L21/823 主分类号 H01L21/20
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