发明名称 |
Method for testing integrated circuit devices |
摘要 |
The present invention is directed to a method and apparatus for testing integrated circuit package devices using automatic testing equipment. The automatic testing equipment may be provided with a light source to enable the testing of image capture type integrated circuit devices. Alternatively, the automatic testing equipment may be provided with an imaging device, e.g., a camera, or both an imaging device and a light source to additionally enable the testing of display type integrated circuit devices.
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申请公布号 |
US6392423(B2) |
申请公布日期 |
2002.05.21 |
申请号 |
US20010814497 |
申请日期 |
2001.03.21 |
申请人 |
AGILENT TECHNOLOGIES, INC. |
发明人 |
PACE BRADLEY D.;SEIDEL DURBIN L.;LAWRENCE WILLIAM RICHARD |
分类号 |
G01R31/26;G01R31/28;G01R31/311;H01L21/66;(IPC1-7):G01R31/308;G01R31/00;G01R31/02 |
主分类号 |
G01R31/26 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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