发明名称 |
CALIBRATION METHOD OF SCATTERED ABSORBER MEASURING APPARATUS AND SCATTERED ABSORBER MEASURING APPARATUS USING THE SAME |
摘要 |
PROBLEM TO BE SOLVED: To provide a calibration method of a scattered absorber measuring apparatus which enables easier execution of measurement for calibration and the calculation of an instrument function and the scattered absorber measuring apparatus using the same. SOLUTION: As scattered absorber SM to be measured by the scattered absorber measuring apparatus, a scattered absorber for calibration with a known optical parameter is set and pulse light from a light source 20 is made incident from a light incidence position A through a light guide 40a for light incidence and the pulse light propagated scattering through the scattered absorber SM is detected by a photo detector 30 through a light guide 40b for detecting light from a light detection position B to perform a measurement for calibration. A measuring waveform obtained by a signal processing part 50 undergoes a comparison operation with a theoretical waveform by an instrument function calculating part 61 of an arithmetic processing part 60 to calculate the instrument function with a measuring apparatus itself. This facilitates the measurement for calibration and the calculation of the instrument function.
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申请公布号 |
JP2002139420(A) |
申请公布日期 |
2002.05.17 |
申请号 |
JP20000331247 |
申请日期 |
2000.10.30 |
申请人 |
HAMAMATSU PHOTONICS KK |
发明人 |
YAMASHITA YUTAKA;MIWA MITSUHARU;URAGAMI TSUNEYUKI |
分类号 |
G01N21/17;A61B10/00;(IPC1-7):G01N21/17 |
主分类号 |
G01N21/17 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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