发明名称 CALIBRATION METHOD OF SCATTERED ABSORBER MEASURING APPARATUS AND SCATTERED ABSORBER MEASURING APPARATUS USING THE SAME
摘要 PROBLEM TO BE SOLVED: To provide a calibration method of a scattered absorber measuring apparatus which enables easier execution of measurement for calibration and the calculation of an instrument function and the scattered absorber measuring apparatus using the same. SOLUTION: As scattered absorber SM to be measured by the scattered absorber measuring apparatus, a scattered absorber for calibration with a known optical parameter is set and pulse light from a light source 20 is made incident from a light incidence position A through a light guide 40a for light incidence and the pulse light propagated scattering through the scattered absorber SM is detected by a photo detector 30 through a light guide 40b for detecting light from a light detection position B to perform a measurement for calibration. A measuring waveform obtained by a signal processing part 50 undergoes a comparison operation with a theoretical waveform by an instrument function calculating part 61 of an arithmetic processing part 60 to calculate the instrument function with a measuring apparatus itself. This facilitates the measurement for calibration and the calculation of the instrument function.
申请公布号 JP2002139420(A) 申请公布日期 2002.05.17
申请号 JP20000331247 申请日期 2000.10.30
申请人 HAMAMATSU PHOTONICS KK 发明人 YAMASHITA YUTAKA;MIWA MITSUHARU;URAGAMI TSUNEYUKI
分类号 G01N21/17;A61B10/00;(IPC1-7):G01N21/17 主分类号 G01N21/17
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