发明名称 TRAIL FOR RECEIVING SEMICONDUCTOR APPARATUS USED FOR AUTOMATIC VISUAL TEST APPARATUS
摘要 PURPOSE: A trail for receiving a semiconductor apparatus used for an automatic visual test apparatus is provided to prevent a misunderstanding of the automatic visual test apparatus for an inclined surface of the trail by varying the structure of a receiving part of the trail. CONSTITUTION: The trail for receiving a semiconductor apparatus used for an automatic visual test apparatus includes a main body(111) and a receiving part(112). The main body(111) is substantially rectangular-shaped and has a flat surface. The plurality of receiving parts(112) are formed in lattice at one surface of the main body(111). The plurality of receiving parts(112) are formed by making the surface of the main body(111) concave to receive semiconductor apparatus(50). Each of the semiconductor apparatus(50) has an information mark which is formed one surface of the semiconductor apparatus(50). Indexes(54) are formed at a portion of a body(52) of each of the semiconductor apparatus(50).
申请公布号 KR20020036144(A) 申请公布日期 2002.05.16
申请号 KR20000066166 申请日期 2000.11.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 HWANG, SEON HONG;KANG, JE BONG;KIM, HYEONG UK;KWAK, SANG MIN
分类号 G01R31/26;H01L21/67;(IPC1-7):G01R31/26 主分类号 G01R31/26
代理机构 代理人
主权项
地址