发明名称 SUBSTRATE WITH WARPAGE CONTROL PATTERN AND GROUP-ENCAPSULATED HALF-FINISHED SEMICONDUCTOR CHIP PACKAGE
摘要 PURPOSE: A group-encapsulated half-finished semiconductor chip package is provided to prevent warpage by compensating for the difference of shrinkage ratios caused by an average thermal expansion ratio in upper and lower portions with respect to the thickness center of the semiconductor chip package. CONSTITUTION: A substrate(17) has an upper surface to which a plurality of semiconductor chips(15) are attached. A warpage control pattern(11) is formed in a region between the semiconductor chips of the substrate. An encapsulating part(13) encapsulating the semiconductor chips is formed on the upper surface of the substrate.
申请公布号 KR20020035939(A) 申请公布日期 2002.05.16
申请号 KR20000065763 申请日期 2000.11.07
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 BAEK, JUNG HYEON;KIM, SANG YEONG;MUN, HO JEONG
分类号 H01L23/12;(IPC1-7):H01L23/12 主分类号 H01L23/12
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